Electrical & Computer Engineering Research Works

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    Quantification of magnetic force microscopy images using combined electrostatic and magnetostatic imaging
    (American Institute of Physics, 1998-06-01) Gomez, R. D.; Pak, A. O.; Anderson, A. J.; Burke, E. R.; Leyendecker, A. J.; Mayergoyz, I. D.
    A method for calibrating the force gradients and probe magnetic moment in phase-contrast magnetic force microscopy ~MFM! is introduced. It is based upon the combined electrostatic force microscopy EFM and MFM images of a conducting non magnetic metal strip. The behavior of the phase contrast in EFM is analyzed and modeled as a finite area capacitor. This model is used in conjunction with the imaging data to derive the proportionality constant between the phase and the force gradient. This calibration is further used to relate the measured MFM images with the field gradient from the same conducting strip to derive the effective magnetic moment of the probe. The knowledge of the phase-force gradient proportionality constant and the probe’s effective moment is essential to directly quantify field derivatives in MFM images.
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    Low temperature behavior of magnetic domains observed using a magnetic force microscope
    (American Institute of Physics, 2001-06-01) Chung, S. H.; Shinde, S. R.; Ogale, S. B.; Venkatesan, T.; Greene, R. L.; Dreyer, M.; Gomez, R. D.
    A commercial atomic force microscope/magnetic force microscope ~MFM! was modified to cool magnetic samples down to around 100 K under a high vacuum while maintaining its routine imaging functionality. MFM images of a 120 nm thick La0.7Ca0.3MnO3 film on a LaAlO3 substrate at low temperature show the paramagnetic-to-ferromagnetic phase transition. Evolution of magnetic domains and magnetic ripples with decreasing temperature are also observed near the edge of a 20 nm thick patterned Co film on a Si substrate.