Quantification of magnetic force microscopy images using combined electrostatic and magnetostatic imaging

dc.contributor.authorGomez, R. D.
dc.contributor.authorPak, A. O.
dc.contributor.authorAnderson, A. J.
dc.contributor.authorBurke, E. R.
dc.contributor.authorLeyendecker, A. J.
dc.contributor.authorMayergoyz, I. D.
dc.date.accessioned2008-08-11T18:04:37Z
dc.date.available2008-08-11T18:04:37Z
dc.date.issued1998-06-01
dc.description.abstractA method for calibrating the force gradients and probe magnetic moment in phase-contrast magnetic force microscopy ~MFM! is introduced. It is based upon the combined electrostatic force microscopy EFM and MFM images of a conducting non magnetic metal strip. The behavior of the phase contrast in EFM is analyzed and modeled as a finite area capacitor. This model is used in conjunction with the imaging data to derive the proportionality constant between the phase and the force gradient. This calibration is further used to relate the measured MFM images with the field gradient from the same conducting strip to derive the effective magnetic moment of the probe. The knowledge of the phase-force gradient proportionality constant and the probe’s effective moment is essential to directly quantify field derivatives in MFM images.en
dc.format.extent139245 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationR.D. Gomez, A.O. Pak, A.J. Anderson, E.R. Burke, A.J. Leyendecker and I.D. Mayergoyz, "Quantification of magnetic force microscopy images using combined electrostatic and magnetostatic imaging", Journal of Applied Physics 83, 6226-6228 (1998)en
dc.identifier.urihttp://hdl.handle.net/1903/8370
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.relation.isAvailableAtA. James Clark School of Engineeringen_us
dc.relation.isAvailableAtElectrical & Computer Engineeringen_us
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_us
dc.relation.isAvailableAtUniversity of Maryland (College Park, MD)en_us
dc.rights.licenseCopyright 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article may be found at http://jap.aip.org/.
dc.subjectmagnetic force microscopy (MFM)en
dc.subjectelectrostatic force microscopy (EFM)en
dc.subjectmagnetic forceen
dc.titleQuantification of magnetic force microscopy images using combined electrostatic and magnetostatic imagingen
dc.typeArticleen

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