A Combined Gate Replacement and Input Vector Control Approach for Leakage Current Reduction
dc.contributor.author | Yuan, Lin | |
dc.contributor.author | Qu, Gang | |
dc.date.accessioned | 2009-03-12T12:44:19Z | |
dc.date.available | 2009-03-12T12:44:19Z | |
dc.date.issued | 2006-02 | |
dc.description.abstract | Input vector control (IVC) is a popular technique for leakage power reduction. It utilizes the transistor stack effect in CMOS gates by applying a minimum leakage vector (MLV) to the primary inputs of combinational circuits during the standby mode. However, the IVC technique becomes less effective for circuits of large logic depth because the input vector at primary inputs has little impact on leakage of internal gates at high logic levels. In this paper, we propose a technique to overcome this limitation by replacing those internal gates in their worst leakage states by other library gates while maintaining the circuit’s correct functionality during the active mode. This modification of the circuit does not require changes of the design flow, but it opens the door for further leakage reduction when the MLV is not effective. We then present a divide-and-conquer approach that integrates gate replacement, an optimal MLV searching algorithm for tree circuits, and a genetic algorithm to connect the tree circuits. Our experimental results on all the MCNC91 benchmark circuits reveal that 1) the gate replacement technique alone can achieve 10% leakage current reduction over the best known IVC methods with no delay penalty and little area increase; 2) the divide-and-conquer approach outperforms the best pure IVC method by 24% and the existing control point insertion method by 12%; and 3) compared with the leakage achieved by optimal MLV in small circuits, the gate replacement heuristic and the divide-and-conquer approach can reduce on average 13% and 17% leakage, respectively. | en |
dc.format.extent | 595229 bytes | |
dc.format.mimetype | application/pdf | |
dc.identifier.citation | L. Yuan and G. Qu. "A Combined Gate Replacement and Input Vector Control Approach for Leakage Current Reduction," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 14, No. 2, pp. 173-182, February 2006. | en |
dc.identifier.uri | http://hdl.handle.net/1903/8960 | |
dc.language.iso | en_US | en |
dc.publisher | IEEE | en |
dc.relation.isAvailableAt | A. James Clark School of Engineering | en_us |
dc.relation.isAvailableAt | Electrical & Computer Engineering | en_us |
dc.relation.isAvailableAt | Digital Repository at the University of Maryland | en_us |
dc.relation.isAvailableAt | University of Maryland (College Park, MD) | en_us |
dc.rights.license | Copyright © 2006] IEEE. Reprinted from IEEE Transactions on Very Large Scale Integration (VLSI) Systems. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Maryland's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. | |
dc.subject | Gate replacement | en |
dc.subject | leakage reduction | en |
dc.subject | minimum leakage vector (MLV) | en |
dc.title | A Combined Gate Replacement and Input Vector Control Approach for Leakage Current Reduction | en |
dc.type | Article | en |
Files
Original bundle
1 - 1 of 1