Joint Modeling Of Responses, Response Time, and Answer Changes in Testlet-based Assessment for Cognitive Diagnosis

dc.contributor.advisorJiao, Hongen_US
dc.contributor.authorYin, Chengbinen_US
dc.contributor.departmentMeasurement, Statistics and Evaluationen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2022-09-23T05:35:18Z
dc.date.available2022-09-23T05:35:18Z
dc.date.issued2022en_US
dc.description.abstractTo address the scenario of testlet-based assessment, this research proposes a joint model of responses, response time, and answer change patterns for testlet-based cognitive diagnostic assessments. A simulation study was conducted to assess the impact of accounting for dual item and item time dependency and of incorporating answer change patterns as an additional data source on model fit, classification accuracy at the attribute and attribute profile level, and parameter estimation. Through manipulating three factors, the simulation study examined the extent to which the manipulated factors impacted the performance of the proposed model and two comparison models in recovering model parameters. Application of the proposed model was demonstrated with an empirical dataset.en_US
dc.identifierhttps://doi.org/10.13016/q5fk-trek
dc.identifier.urihttp://hdl.handle.net/1903/29261
dc.language.isoenen_US
dc.subject.pqcontrolledEducational tests & measurementsen_US
dc.subject.pqcontrolledStatisticsen_US
dc.subject.pquncontrolledAnswer Change Patternsen_US
dc.subject.pquncontrolledCognitive Diagnostic Modelen_US
dc.subject.pquncontrolledDual Item and Item Time Dependencyen_US
dc.subject.pquncontrolledJoint Modelsen_US
dc.subject.pquncontrolledProcess Data Modelingen_US
dc.subject.pquncontrolledTestlet-based Assessmenten_US
dc.titleJoint Modeling Of Responses, Response Time, and Answer Changes in Testlet-based Assessment for Cognitive Diagnosisen_US
dc.typeDissertationen_US

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