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Magnetic imaging in the presence of external fields: Technique and applications (invited)

dc.contributor.authorGomez, Romel D.
dc.contributor.authorBurke, Edward R.
dc.contributor.authorMayergoyz, Isaak D.
dc.date.accessioned2008-08-21T15:00:37Z
dc.date.available2008-08-21T15:00:37Z
dc.date.issued1996-04-15
dc.identifier.citationR.D. Gomez, E.R. Burke and I.D. Mayergoyz, "Magnetic Imaging in the Presence of an External Field: Technique and Applications (INVITED)", Journal of Applied Physics 79, 6441-6446 (1996).en
dc.identifier.urihttp://hdl.handle.net/1903/8391
dc.description.abstractMagnetic force microscopy (MFM) in the presence of an external magnetic field has been developed. This has led to further understanding of image formation in MFM as well as new insights concerning the interaction of magnetic recording media with an external field. Our results confirm that, at low applied fields, image formation results from the interaction of the component by the local surface field along the direction of the probe’s magnetization. By reorienting the probe’s magnetization by an appropriate application of an external field, it is possible to selectively image specific components of the local field. At higher applied fields, the probe becomes saturated and the changes in the images may be attributed to magnetization reversal of the sample. We have observed the transformations that occur at various stages of the dc erasure of thin-film recording media. This technique has also been applied to conventional magneto-optical media to study domain collapse caused by increasing temperature with an external bias field. The methods, results, and their analysis are presented.en
dc.format.extent657557 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.subjectMagnetic force microscopy (MFM)en
dc.subjectmagnetic recording mediaen
dc.titleMagnetic imaging in the presence of external fields: Technique and applications (invited)en
dc.typeArticleen
dc.relation.isAvailableAtA. James Clark School of Engineeringen_us
dc.relation.isAvailableAtElectrical & Computer Engineeringen_us
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_us
dc.relation.isAvailableAtUniversity of Maryland (College Park, MD)en_us
dc.rights.licenseCopyright 1997 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article may be found at http://jap.aip.org/.


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