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Home
A. James Clark School of Engineering
Institute for Systems Research Technical Reports
Variability Driven Gate Sizing for Binning Yield Optimization
Variability Driven Gate Sizing for Binning Yield Optimization
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TR_2006-2.pdf
(144.73 KB)
No. of downloads: 764
Publication or External Link
Date
2006
Authors
Davoodi, Azadeh
Srivastava, Ankur
Advisor
Citation
DRUM DOI
Abstract
Notes
URI (handle)
http://hdl.handle.net/1903/6582
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Institute for Systems Research Technical Reports
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