Variability Driven Gate Sizing for Binning Yield Optimization

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dc.contributor.authorDavoodi, Azadehen_US
dc.contributor.authorSrivastava, Ankuren_US
dc.contributor.departmentISRen_US
dc.date.accessioned2007-05-23T10:18:25Z
dc.date.available2007-05-23T10:18:25Z
dc.date.issued2006en_US
dc.description.abstracten_US
dc.format.extent148207 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/6582
dc.language.isoen_USen_US
dc.relation.ispartofseriesISR; TR 2006-2en_US
dc.subjectNext-Generation Product Realization Systemsen_US
dc.titleVariability Driven Gate Sizing for Binning Yield Optimizationen_US
dc.typeTechnical Reporten_US

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