Institute for Systems Research Technical Reports

Permanent URI for this collectionhttp://hdl.handle.net/1903/4376

This archive contains a collection of reports generated by the faculty and students of the Institute for Systems Research (ISR), a permanent, interdisciplinary research unit in the A. James Clark School of Engineering at the University of Maryland. ISR-based projects are conducted through partnerships with industry and government, bringing together faculty and students from multiple academic departments and colleges across the university.

Browse

Search Results

Now showing 1 - 10 of 27
  • Thumbnail Image
    Item
    A Comparative Study of Reactor Designs for the Production of Graded Films with Applications to Combinatorial CVD
    (2007-10-24) Sreenivasan, Ramaswamy; Adomaitis, Raymond A.
    Segmented CVD reactor designs enabling spatial control of across-wafer gas phase composition were evaluated for depositing graded films suitable for combinatorial studies. Specifically two reactor designs were constructed and evaluated with experiments and response surface model (RSM) based analysis to quantify the reactor performance in terms of film thickness uniformity, sensitivity to adjustable reactor operating conditions, range of thickness over which uniformity could be achieved and each reactor’s ability to control the thickness gradient across the wafer surface. Design features distinguishing the two reactor systems and their influence on gradient control versus deposition rate performance are summarized. RS models relating wafer state properties to process recipes are shown to be effective tools to quantify, qualify and compare different reactor designs.
  • Thumbnail Image
    Item
    A Comparative Study of Reactor Designs for the Production of Graded Films with Applications to Combinatorial CVD
    (2007) Sreenivasan, Ramaswamy; Adomaitis, Raymond A.; Rubloff, Gary W.; ISR
    Segmented CVD reactor designs enabling spatial control of across-wafer gas phase composition were evaluated for depositing graded films suitable for combinatorial studies. Specifically two reactor designs were constructed and evaluated with experiments and response surface model (RSM) based analysis to quantify the reactor performance in terms of film thickness uniformity, sensitivity to adjustable reactor operating conditions, range of thickness over which uniformity could be achieved and each reactor ability to control the thickness gradient across the wafer surface. Design features distinguishing the two reactor systems and their influence on gradient control versus deposition rate performance are summarized. RS models relating wafer state properties to process recipes are shown to be effective tools to quantify, qualify and compare different reactor designs.
  • Thumbnail Image
    Item
    A NEW APPROACH TO SPATIALLY CONTROLLABLE CVD
    (2004) Choo, Jae-Ouk; Adomaitis, Raymond A.; Rubloff, Gary W.; Henn-Lecordier, Laurent; Cai, Yuhong; Adomaitis, Raymond A.; ISR
    This paper describes the continuing design evolution of a new approach to spatially controllable chemical vapor deposition for electronic materials manufacturing. Based on the success of a previous prototype reactor, we describe construction of a newer version of the prototype reactor system to assess its performance and identify its key operational characteristics. This new design includes a fully automated feed gas control system, allowing the reprogramming of reactor operation without hardware modifications and a time-shared gas sampling mass spectrometer for spatially resolved across-wafer gas composition analysis.
  • Thumbnail Image
    Item
    Simulator Development for a Spatially Controllable Chemical Vapor Deposition System
    (2002) Choo, Jae-Ouk; Adomaitis, Raymond A.; Rubloff, Gary W.; Henn-Lecordier, Laurent; Liu, Yijun; ISR
    Most conventional chemical vapor deposition systems do not have the spatial actuation and sensing capabilities necessary to control deposition uniformity, or to intentionally induce nonuniform deposition patterns for single-wafer combinatorial CVD experiments. In an effort to address this limitation, we began a research program at the University of Maryland focusing on the development of a novel CVD reactor system that can explicitly control the (2-dimensional) spatial profile of gas-phase chemical composition across the wafer surface.

    This reactor is based on a novel segmented showerhead design in which gas precursor composition can be individually controlled in the gas fed to each segment. Because the exhaust gas is recirculated up through the showerhead though the individual segments, the gas flow pattern created eliminates convective mass transfer between the segment regions. The effect of this design is a CVD system in which across-wafer composition gradients can be accurately predicted and controlled.

    This paper discusses the development of a simulator for a three-segment prototype that has recently been constructed as a modification to an Ulvac ERA1000 CVD cluster tool. A preliminary set of experiments has been performed to evaluate the performance of the prototype in depositing tungsten films for a range of wafer/showerhead spacing and segment gas compositions. We discuss the simulation approach taken to developing the simulator for this system focusing on a one-dimensional simulation of transport through the segments and exhaust mixing region, a model valid in the limit of close showerhead/wafer spacing. The use of simulation in the prototype system design, interpreting experimental data, and its ultimate use in controlling the CVD process to achieve true programmable CVD operation all will be discussed. Further information can be found at the project website, http://www.isr.umd.edu/Labs/CACSE/research/progrxr

  • Thumbnail Image
    Item
    An XML-Based Approach to Integrating Semiconductor Process Information
    (2002) Chen, Jing; Adomaitis, Raymond A.; Adomaitis, Raymond A.; ISR
    This paper discusses the development of a Java and XML-based semiconductor process information system for experimental data archiving, processing, analysis, presentation and simulation.

    The three-tier system architecture consists of a web-based GUI interface module, a business-handling module and a data services module. The user-friendly web-based GUI interface enables users to look up experimental results according to operating conditions, or to determine material and process gas physical properties using a physical property estimator, or to query and retrieve experimental data and run client-side simulations in the MATLAB environment.

    Simulation results can be compared to experimental data to validate process models or used to optimize the operating conditions. The business-handling module interprets user's request to determine which information is required and how that information is extracted and synthesized from the back-end database. After this information is obtained, it is delivered to the users in an appropriate format (XML/HTML).

  • Thumbnail Image
    Item
    Objects for MWR
    (2001) Adomaitis, Raymond A.; ISR
    A computational framework has been developed for step-by-step implementation of global spectral projection methods used for solving boundary-value problems and analyzing solutions produced using the numerical techniques of this framework. A set of Matlab-based functions corresponding to each step in a Galerkin discretization procedure has been developed with emphasis on simplifying the implementation of discretization methods for nonlinear, distributed-parameter system models in up to three-dimensional physical domains. A key feature of this computational approach is that a set of object classes were developed to facilitate implementation of the weighted residual methods (MWR) in an effort to make the connection between the solution procedures and modeling equations as clear as possible. The utility of the computational procedures is demonstrated through applications to two-dimensional reaction-diffusion and fluid flow problems, and a three-dimensional heat transfer problem in semiconductor manufacturing.
  • Thumbnail Image
    Item
    Parameter Identification and Simulation of a Thin Film Conducting Polymer Gas Sensor
    (2001) Li, Yong; Adomaitis, Raymond A.; McAvoy, Thomas J.; ISR
    Thin film conducting polymer gas composition sensors can be used forindustrial safety monitoring, environmental pollution control, and numerousother applications. In this paper, a sensor system model is developed andthis model is used to compare a lumped circuit to a transmission lineformulation of the equivalent circuits describing the polymer film andelectrodes; the sensor model includes the adsorption/desorption processand the electric properties of the sensor. The simulation approachcombines physically based modeling and parameter estimation, in which asubset of model parameters are estimated using published experimentaldata. The simulation results are found to be useful for interpretingconduction polymer sensor responses to different gas species.
  • Thumbnail Image
    Item
    Influence of Gas Composition on Wafer Temperature Control in a Tungsten Chemical Vapor Deposition Reactor
    (2000) Chang, Hsiao-Yung; Adomaitis, Raymond A.; Kidder, John N., Jr.; Rubloff, Gary W.; ISR
    Experimental measurements of wafer temperature in a single-wafer,lamp-heated CVD system were used to study the wafer temperature responseto gas composition. A physically based simulation procedure for theprocess gas and wafer temperature was developed in which a subset ofparameter values were estimated using a nonlinear, iterative parameteridentification method, producing a validated model with true predictivecapabilities.

    With process heating lamp power held constant, wafertemperature variations of up to 160 degrees K were observed by varying feed gasH_2/N_2 ratio. Heat transfer between the wafer and susceptor wasstudied by shifting the instrumented wafer off the susceptor axis,exposing a portion of the wafer backside to the chamber floor. Modelpredictions and experimental observations both demonstrated that the gasvelocity field had little influence on the observed wafer and predictedgas temperatures.

  • Thumbnail Image
    Item
    Spectral Filtering for Improved Performance of Collocation Discretization Methods
    (2000) Adomaitis, Raymond A.; ISR
    Spectral filtering methods are investigated for use in reducing the Gibbs oscillations that result when discontinuous functions are projected onto globally definedtrial function expansions. Several physical-space filters are studied in the context of a high-degree, mixed collocation method used for time integration of a nonlinear boundary value problem with a piece-wise continuous, time-dependentboundary condition. Improved accuracy is reported, both in terms of point-wiseand norm-wise solution convergence, making the filtered global collocationapproach a potential alternative to spline formulations in some applications.
  • Thumbnail Image
    Item
    A Spectrally Filtered, Least-Squares Projection Method for Stokes Flow Problems in Driven Cavities
    (1999) Adomaitis, Raymond A.; ISR
    A least-squares, weighted residual projection method is presented forcomputingStokes flow solutions to driven cavity problems in rectangular andcylindrical geometries.In this procedure, thevelocity field components are first defined by eigenfunction expansionsolutions to the Stokes flow problem in terms of an unknown pressure fieldwhich is subsequentlycomputed by minimizing the continuity equation residual norm by theleast-squaresprojection. The role of spectral filtering methods for improving pointwisesolutionconvergence is also discussed.