Health Status Assessment Methodology for Electronic Hardware

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dc.contributor.advisorPecht, Michaelen_US
dc.contributor.authorMathew, Sonyen_US
dc.contributor.departmentMechanical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2005-08-03T14:32:46Z
dc.date.available2005-08-03T14:32:46Z
dc.date.issued2005-04-29en_US
dc.description.abstractRemaining life assessment is the process of predicting the future operational life of a product based on estimate of life consumed under its life cycle environmental conditions. Remaining life is typically an output of health monitoring and prognostics. In this thesis, a generic 'Health Status Assessment' methodology has been developed, that provides a guideline for conducting a remaining life assessment for electronic hardware already deployed in the field. The methodology presents the assessor with the possible techniques that can be used and the criteria for implementing each technique. A practical application of the new methodology is demonstrated by assessing the remaining life of an electronic circuit card subjected to shock and random vibration loads in its life cycle environment. During life testing, a mechanical support structure on the board was damaged. Analytical and finite element methods were employed to determine and explain the cause of failure.en_US
dc.format.extent4658597 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/2507
dc.language.isoen_US
dc.subject.pqcontrolledEngineering, Mechanicalen_US
dc.subject.pquncontrolledRemaining lifeen_US
dc.subject.pquncontrolledHealth monitoringen_US
dc.subject.pquncontrolledRandom vibrationen_US
dc.subject.pquncontrolledShocken_US
dc.subject.pquncontrolledVirtual assessmenten_US
dc.subject.pquncontrolledLife testingen_US
dc.titleHealth Status Assessment Methodology for Electronic Hardwareen_US
dc.typeThesisen_US

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