The Set-Valued Run-to-Run Controller with Ellipsoid Approximation
dc.contributor.advisor | Baras, John S. | en_US |
dc.contributor.author | Zhang, Chang | en_US |
dc.contributor.author | Baras, John S. | en_US |
dc.contributor.department | ISR | en_US |
dc.date.accessioned | 2007-05-23T10:09:24Z | |
dc.date.available | 2007-05-23T10:09:24Z | |
dc.date.issued | 2000 | en_US |
dc.description.abstract | In order to successfully apply Run-to-Run (RtR) control or real time control ina semiconductor process, it is very important to estimate the processmodel. Traditional semiconductor process control methods neglect theimportance of robustness due to the estimation methods they use. <p>A new approach, namely the set-valued RtR controller with ellipsoidapproximation, is proposed to estimate the process model from acompletely different point of view. Because the set-valued RtRcontroller identifies the process model in the feasible parameter setwhich is insensitive to noises, the controller is robust to theenvironment noises.Ellipsoid approximation can significantly reduce the computation load for the set-valued method. <p>In this paper, the Modified Optimal Volume Ellipsoid (MOVE) algorithm is used toestimate the process model in each run. Designof the corresponding controller and parameter selection of the controller are introduced.Simulation results showed that the controller is robust toenvironment noises and model errors. | en_US |
dc.format.extent | 409667 bytes | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/1903/6135 | |
dc.language.iso | en_US | en_US |
dc.relation.ispartofseries | ISR; TR 2000-32 | en_US |
dc.subject | optimization | en_US |
dc.subject | robust control | en_US |
dc.subject | stability | en_US |
dc.subject | manufacturing | en_US |
dc.subject | measurements | en_US |
dc.subject | run-to-run (RtR) control | en_US |
dc.subject | set-valued | en_US |
dc.subject | ellipsoid | en_US |
dc.subject | modified OVE (MOVE) algorithm | en_US |
dc.subject | DHOBE algorithm | en_US |
dc.subject | semiconductor manufacturing process control, | en_US |
dc.title | The Set-Valued Run-to-Run Controller with Ellipsoid Approximation | en_US |
dc.type | Technical Report | en_US |
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