Optimal Wavelet Basis Selection for Signal Representation

dc.contributor.authorZhuang, Y.en_US
dc.contributor.authorBaras, John S.en_US
dc.contributor.departmentISRen_US
dc.contributor.departmentCSHCNen_US
dc.date.accessioned2007-05-23T09:58:10Z
dc.date.available2007-05-23T09:58:10Z
dc.date.issued1994en_US
dc.description.abstractWe study the problem of choosing the optimal wavelet basis with compact support for signal representation and provide a general algorithm for computing the optimal wavelet basis. We first briefly review the multiresolution property of wavelet decomposition and the conditions for generating a basis of compactly supported discrete wavelets in terms of properties of quadrature mirror filter (QMF) banks. We then parametrize the mother wavelet and scaling function through a set of real coefficients. We further introduce the concept of information measure as a distance measure between the signal and its projection onto the subspace spanned by the wavelet basis in which the signal is to be reconstructed. The optimal basis for a given signal is obtained through minimizing this information measure. We have obtained explicitly the sensitivity of dilations and shifts of the mother wavelet with respect to the coefficient set. A systematic approach is developed here to derive the information gradient with respect to the parameter set for a given square integrable signal and the optimal wavelet basis. A gradient based optimazation algorithm is developed in this paper for computing the optimal wavelet basis.en_US
dc.format.extent237341 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/5588
dc.language.isoen_USen_US
dc.relation.ispartofseriesISR; TR 1994-3en_US
dc.relation.ispartofseriesCSHCN; TR 1994-7en_US
dc.subjectdata compressionen_US
dc.subjectimage processingen_US
dc.subjectsignal processingen_US
dc.subjectspeech processingen_US
dc.subjectwaveletsen_US
dc.subjectSystems Integrationen_US
dc.titleOptimal Wavelet Basis Selection for Signal Representationen_US
dc.typeTechnical Reporten_US

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