A. James Clark School of Engineering

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Author: search.filters.author.Krafft, C.Subject: search.filters.subject.magnetic force microscopy (MFM)

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    Spin-stand imaging of overwritten data and its comparison with magnetic force microscopy
    (American Institute of Physics, 2001-06-01) Mayergoyz, I. D.; Tse, C.; Krafft, C.; Gomez, R. D.
    A new technique of magnetic imaging on a spin-stand [Mayergoyz et al., J. Appl. Phys. 87, 6824 (2000)] is further developed and extensively tested. The results of successful imaging of digital patterns overwritten with misregistration ranging from 0.3 to 0.07 mm are reported. The results are compared with magnetic force microscopy (MFM) images and the conclusion is reached that the spin-stand imaging technique can provide (at least) the same level of resolution and accuracy as the MFM imaging technique.