Spin-stand imaging of overwritten data and its comparison with magnetic force microscopy
Spin-stand imaging of overwritten data and its comparison with magnetic force microscopy
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Date
2001-06-01
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Citation
I.D. Mayergoyz, C. Tse, C. Krafft, and R.D. Gomez, "Spin-stand imaging of overwritten data and its comparison with magnetic force microscopy", Journal of Applied Physics 89, 6772-6774 (2001).
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Abstract
A new technique of magnetic imaging on a spin-stand [Mayergoyz et al., J. Appl. Phys. 87, 6824 (2000)] is further developed and extensively tested. The results of successful imaging of digital patterns overwritten with misregistration ranging from 0.3 to 0.07 mm are reported. The results are compared with magnetic force microscopy (MFM) images and the conclusion is reached that the spin-stand imaging technique can provide (at least) the same level of resolution and accuracy as the MFM imaging technique.