Mechanical Engineering
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Item Anisotropic Multi-scale Modeling for Steady-state Creep Behavior of Oligocrystalline SnAgCu (SAC) Solder Joints(2021) Jiang, Qian; Dasgupta, Abhijit; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)Heterogeneous integration is leading to unprecedented miniaturization of solder joints. The overall size of solder interconnections in current-generation microelectronics assemblies has length-scales that are comparable to that of the intrinsic heterogeneities of the solder microstructure. In particular, there are only a few highly anisotropic grains in each joint. This makes the mechanical response of each joint quite unique. Rigorous mechanistic approaches are needed for quantitative understanding of the response of such joints, based on the variability of the microstructural morphology. The discrete grain morphology of as-solidified oligocrystalline SAC (SnAgCu) solder joints is explicitly modeled in terms of multiple length scales (four tiers of length scales are used in the description here). At the highest length-scale in the joint (Tier 3), there are few highly anisotropic viscoplastic grains in each functional solder joint, connected by visoplastic grain boundaries. At the next lower tier (Tier 2), the primary heterogeneity within each grain is due to individual dendrites of pro-eutectic β-Sn. Additional microscale intermetallic compounds of Cu6Sn5 rods are located inside individual grains. Packed between the dendrite lobes is a eutectic Ag-Sn alloy, The next lower length-scale (Tier 1), deals with the microstructure of the Ag-Sn eutectic phase, consisting of nanoscale Ag3Sn IMC particles dispersed in a β-Sn matrix. The characteristic length scale and spacing of the IMC particles in this eutectic mix are important features of Tier 1. Tier 0 refers to the body-centered tetragonal (BCT) anisotropic β-Sn crystal structure, including the dominant slip systems for this crystal system. The objective of this work is to provide the mechanistic framework to quantify the mechanical viscoplastic response of such solder joints. The anisotropic mechanical behavior of each solder grain is modeled with a multiscale crystal viscoplasticity (CV) approach, based on anisotropic dislocation mechanics and typical microstructural features of SAC crystals. Model constants are calibrated with single crystal data from the literature and from experiments. This calibrated CV model is used as single-crystal digital twin, for virtual tests to determine the model constants for a continuum-scale compact anisotropic creep model for SAC single crystals, based on Hill’s anisotropic potential and an associated creep flow-rule. The additional contribution from grain boundary sliding, for polycrystalline structures, is investigated by the use of a grain-boundary phase, and the properties of the grain boundary phase are parametrically calibrated by comparing the model results with creep test results of joint-scale few-grained solder specimens. This methodology enables user-friendly computationally efficient finite element simulations of multi-grain solder joints in microelectronic assemblies and facilitates parametric sensitivity studies of different grain configurations. This proposed grain-scale modeling approach is explicitly sensitive to microstructural features such as the morphology of: (i) the IMC reinforcements in the eutectic phase; (ii) dendrites; and (iii) grains. Thus, this model is suited for studying the effect of microstructural tailoring and microstructural evolution. The developed multiscale modeling methodology will also empower designers to numerically explore the worst-case and best-case microstructural configurations (and corresponding stochastic variabilities in solder joint performance and in design margins) for creep deformation under monotonic loading, for creep-fatigue under thermal cycling as well as for creep properties under isothermal aging conditions.Item EFFECT OF LONG-TERM AGING ON LEAD-FREE SOLDER AND SURFACE FINISH(2017) Pandian, Guru Prasad; Pecht, Michael G; Das, Diganta; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)Since 2006, commercial electronics manufacturers have been banned from using lead-based materials and other toxic materials in their products due to the RoHS directive from the European Union. This led to industries transitioning to lead-free materials to be used in solder and surface finishes of their products. Although all of commercial electronics industry has transitioned to lead-free materials, some of the reliability and safety critical products used in industries such as defense, aerospace, automobile, and healthcare sectors are still exempted from the lead-free regulation. These industries are hesitant to transition to lead-free due to lack of data and hence the confidence on the long-term reliability of lead-free electronics. Known issues of tin whiskers and solder interconnect fatigue which can arise later in a products life have raised concerns related to the use of lead-free materials in electronic assemblies. To address these concerns, 10 year old lead-free systems were examined to determine the solder interconnect degradation level and tin whisker risk level.Item Multiscale Modeling of the Anisotropic Creep Response of SnAgCu Single Crystal(2015) Mukherjee, Subhasis; Dasgupta, Abhijit; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)The lack of statistical homogeneity in functional SnAgCu (SAC) solder joints due to their coarse grained microstructure, in conjunction with the severe anisotropy exhibited by single crystal Sn, renders each joint unique in terms of mechanical behavior. An anisotropic multiscale modeling framework is proposed in this dissertation to capture the influence of the inherent elastic anisotropy and grain orientation in single crystal Sn on the primary and secondary creep response of single crystal SnAgCu (SAC) solder. Modeling of microstructural deformation mechanisms in SnAgCu (SAC) solder interconnects requires a multiscale approach because of tiered microstructural heterogeneities. The smallest length scale (Tier 0) refers to the Body Centered Tetragonal (BCT) structure of the Sn matrix itself because it governs: (1) the associated dislocation slip systems, (2) dislocation line tension (3) dislocation mobility and (4) intrinsic orthotropy of mechanical properties in the crystal principal axis system. The next higher length scale, (Tier 1), consists of nanoscale Ag3Sn intermetallic compounds (IMCs) surrounded by Body Centered Tetragonal (BCT) Sn to form the eutectic Sn-Ag phase. The next higher length scale (Tier 2) consists of micron scale lobes of pro-eutectic Sn dendrites surrounded by eutectic Sn-Ag regions and reinforced with micron scale Cu6Sn5 IMCs. Unified modeling of above two length scales provides constitutive properties for SAC single crystal. Tier 3 in coarse-grained solder joints consists of multiple SAC crystals along with grain boundaries. Finally, Tier 4 consists of the structural length scale of the solder joint. Line tension and mobility of dislocations (Tier 0) in dominant slip systems of single crystal Sn are captured for the elastic crystal anisotropy of body centered tetragonal (BCT) Sn by using Stroh's matrix formalism. The anisotropic creep rate of the eutectic Sn-Ag phase of Tier I is then modeled using above inputs and the evolving dislocation density calculated for the dominant glide systems. The evolving dislocation density history is estimated by modeling the equilibrium between three competing processes: (1) dislocation generation; (2) dislocation impediment (due to backstress from forest dislocations in the Sn dendrites and from the Ag3Sn IMC particles in the eutectic phase); and (3) dislocation recovery (by climb/diffusion from forest dislocations in the Sn dendrites and by climb/detachment from the Ag3Sn IMC particles in the eutectic phase). The creep response of the eutectic phase (from Tier 1) is combined with creep of ellipsoidal Sn lobes at Tier 2 using the anisotropic Mori-Tanaka homogenization theory, to obtain the creep response of SAC305 single crystal along global specimen directions and is calibrated to experimentally obtained creep response of a SAC305 single crystal specimen. The Eshelby strain concentration tensors required for this homogenization process are calculated numerically for ellipsoidal Sn inclusions embedded in anisotropic eutectic Sn-Ag matrix. The orientations of SAC single crystal specimens with respect to loading direction are identified using orientation image mapping (OIM) using Electron Backscatter Diffraction (EBSD) and then utilized in the model to estimate the resolved shear stress along the dominant slip directions. The proposed model is then used for investigating the variability of the transient and secondary creep response of Sn3.0Ag0.5Cu (SAC305) solder, which forms the first objective of the dissertation. The transient creep strain rate along the [001] direction of SAC305 single crystal #1 is predicted to be 1-2 orders of magnitude higher than that along the [100]/[010] direction. Parametric studies have also been conducted to predict the effect of changing orientation, aspect ratio and volume fraction of Sn inclusions on the anisotropic creep response of SAC single crystals. The predicted creep shear strain along the global specimen direction is found to vary by a factor of (1-3) orders of magnitude due to change in one of the Euler angles (j1) in SAC305 single crystal #1, which is in agreement with the variability observed in experiments. The second objective of this dissertation focuses on using this proposed modeling framework to characterize and model the creep constitutive response of new low-silver, lead-free interconnects made of Sn1.0Ag0.5Cu (SAC105) doped with trace elements, viz., Manganese (Mn) and Antimony (Sb). The proposed multiscale model is used to mechanistically model the improvement in experimentally observed steady state creep resistance of above SAC105X solders due to the microalloying with the trace elements. The third and final objective of this dissertation is to use the above multiscale microstructural model to mechanistically predict the effect of extended isothermal aging on experimentally observed steady state creep response of SAC305 solders. In summary, the proposed mechanistic predictive model is demonstrated to successfully capture the dominant load paths and deformation mechanisms at each length scale and is also shown to be responsive to the microstructural tailoring done by microalloying and the continuous microstructural evolution because of thermomechanical life-cycle aging mechanisms in solders.Item Methods and Models for Assessing Solder Interconnect Reliability of Control Boards in Power Electronic Systems(2013) Squiller, David; McCluskey, Patrick; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)Over the past 20 years, power electronic systems have been increasingly required to operate in harsh environments including automotive, deep-well drilling and aerospace applications. In parallel, the higher power densities and miniaturization of the power switching module result in elevated stress levels on the control circuitry. The objective of this study was to develop methods and models for assessing the interconnect reliability of components used in the control circuitry for power electronic systems. Physics-of-Failure modeling and a series of thermal and reliability simulations were conducted on a 2.2 kW variable-frequency drive to evaluate the susceptibility of system level and component level failure mechanisms. Assessment methods consisted of developing CalcePWA simulation models of the primary sub-assemblies and constructing a power cycling apparatus to perform accelerated testing of the drive.Item MODELING THE PHYSICS OF FAILURE FOR ELECTRONIC PACKAGING COMPONENTS SUBJECTED TO THERMAL AND MECHANICAL LOADING(2011) Sharon, Gilad; Barker, Donald D; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)This dissertation presents three separate studies that examined electronic components using numerical modeling approaches. The use of modeling techniques provided a deeper understanding of the physical phenomena that contribute to the formation of cracks inside ceramic capacitors, damage inside plated through holes, and to dynamic fracture of MEMS structures. The modeling yielded numerical substantiations for previously proposed theoretical explanations. Multi-Layer Ceramic Capacitors (MLCCs) mounted with stiffer lead-free solder have shown greater tolerance than tin-lead solder for single cycle board bending loads with low strain rates. In contrast, flexible terminations have greater tolerance than stiffer standard terminations under the same conditions. It has been proposed that residual stresses in the capacitor account for this disparity. These stresses have been attributed to the higher solidification temperature of lead free solders coupled with the CTE mismatch between the board and the capacitor ceramic. This research indicated that the higher solidification temperatures affected the residual stresses. Inaccuracies in predicting barrel failures of plated through holes are suspected to arise from neglecting the effects of the reflow process on the copper material. This research used thermo mechanical analysis (TMA) results to model the damage in the copper above the glass transition temperature (Tg) during reflow. Damage estimates from the hysteresis plots were used to improve failure predictions. Modeling was performed to examine the theory that brittle fracture in MEMS structures is not affected by strain rates. Numerical modeling was conducted to predict the probability of dynamic failure caused by shock loads. The models used a quasi-static global gravitational load to predict the probability of brittle fracture. The research presented in this dissertation explored drivers for failure mechanisms in flex cracking of capacitors, barrel failures in plated through holes, and dynamic fracture of MEMS. The studies used numerical modeling to provide new insights into underlying physical phenomena. In each case, theoretical explanations were examined where difficult geometries and complex material properties made it difficult or impossible to obtain direct measurements.Item COMPARISON OF INTERCONNECT FAILURES OF ELECTRONIC COMPONENTS MOUNTED ON FR-4 BOARDS WITH SN37PB AND SN3.0AG0.5CU SOLDERS UNDER RAPID LOADING CONDITIONS.(2010) Gregory, Patrice Belnora; Barker, Donald B; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)Electronic circuit boards can experience rapid loading through shock or vibration events during their lives; these events can happen in transportation, manufacture, or in field conditions. Due to the lead-free migration, it is necessary to evaluate how this rapid loading affects the durability of a leading lead free solder alternative (Sn3.0Ag0.5Cu) assemblies as compared with traditional eutectic lead based solder Sn37Pb assemblies. A literature review showed that there is little agreement on the fatigue behavior of Sn37Pb solder assemblies and Sn3.0Ag0.5Cu solder assemblies subjected to rapid loading. To evaluate the failure behavior of Sn37Pb and Sn3.0Ag0.5Cu solder assemblies under rapid loading conditions, leadless chip resistors (LCR), ball grid arrays (BGA), small outline integrated circuits (SOIC), and small outline transistors (SOT) were subjected to four point bend tests via a servo-hydraulic testing machine at printed wiring board (PWB) strain rates greater than 0.1/s. The PWB strain was the metric used to evaluate the failures. The PBGAs and LCRs were examined with both Sn37Pb and Sn3.0Ag0.5Cu solders. There was no significant difference found in the resulting test data for the behavior of the two solder assembly types in the high cycle fatigue regime. PBGA assemblies with both solders were also evaluated at a higher strain rate, approximately 1/s, using drop testing. There was no discernable difference found between the assemblies as well as no difference in the failure rate of the PBGAs at this higher strain rate. The PWB strain was converted to an equivalent solder stress index using finite element analysis. This equivalent stress index value was used to compare the results from the LCR and BGA testing for Sn37Pb and Sn3.0Ag0.5Cu. Independently generated BGA data that differed with respect to many testing variables was adjusted and incorporated to this comparison. The resulting plot did not show any significant differences between the behaviors of the two solder assemblies under rapid loading outside of the ultra low cycle fatigue regime, where the assemblies with Sn37Pb solder outperformed the assemblies with SnAgCu solder.Item Effect of Dynamic Flexural Loading on the Durability and Failure Site of Solder Interconnects in Printed Wiring Assemblies(2007-12-04) Varghese, Joseph; Dasgupta, Abhijit; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)This dissertation investigates the durability of solder interconnects of area array packages mounted on Printed Wiring Assemblies (PWAs) subjected to dynamic flexural loads, using a combination of testing, empirical curve fitting and mechanistic modeling. Dynamic 4-point bend tests are conducted on a drop tower and with an impact pendulum. Failure data is collected and an empirical rate-dependent durability model, based on mechanistic considerations, is developed to estimate the fatigue failure envelopes of the solder, as a function of solder strain and strain-rate. The solder plastic strain histories are obtained from the PWA flexural strain and strain rate, using transfer functions developed from 3D transient Finite Element Analysis (FEA) with rate-dependent solder material properties. The test data also shows the existence of multiple competing failure sites: solder, copper trace, PWB under solder pads, and layers of intermetallic compound (IMC) between the solder and solder pads. The failures in the IMC layers are found to be either in the bulk of the IMC layers or at the interface between different species of IMC layers. The dominant failure site is found to be strongly dependent on the loading conditions. The empirical model is demonstrated for solder failures as well as Cu trace failures, and the transition between their competing failure envelopes is identified. This dissertation then focuses in detail on two of these competing failure sites: (i) the solder and (ii) the interface between two IMC layers. A strain-range fatigue damage model, based on strain-rate hardening and exhaustion of ductility, is used to quantify the durability and estimate the fatigue constants of the solder for high strain rates of loading. Interfacial fracture mechanics is used to estimate the damage accumulation rates at the IMC interface. The IMC failure model and the solder failure model provide a mechanistic perspective on the failure site transitions. Durability metrics, based on the mechanics of these two failure mechanisms, are used to quantify the competing damage accumulation rates at the two failure sites for a given loading condition. The results not only identify which failure site dominates but also provide estimate of the durability of the solder interconnect. The test data shows good correlation with the model predictions. The test vehicles used in this study consist of PWAs with Sn37Pb solder interconnects. But the proposed test methodologies and mechanistic models are generic enough to be easily extended to other emerging lead free solder materials. Wherever possible, suggestions are provided for the development of test techniques or phenomenological models which can be used for engineering applications. A methodology is proposed in the appendix to implement the findings of this thesis in real-world applications. Damage in the solder interconnect is quantified in terms of generic empirical metrics, PWA flexural strain and strain rate. It is shown that the proposed metrics (PWA strain and strain rate) can quantify the durability of the solder interconnect, irrespective of the loading orientation or the PWA boundary conditions.Item DEVELOPMENT OF MOIRÉ INTERFEROMETRY FOR REAL-TIME OBSERVATION OF NONLINEAR THERMAL DEFORMATIONS OF SOLDER AND SOLDER ASSEMBLY(2005-04-20) Cho, Seungmin; Han, Bongtae; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)An experimental apparatus using moiré interferometry is developed to characterize the thermo-mechanical behavior of solder joints. A compact moiré interferometer is combined with an environmental chamber to allow real-time observation of non-linear and time-dependent solder and solder assemblies. The first apparatus is based on convection heating and cooling to simulate an accelerated thermal cycling (ATC) condition. Vibrations caused by an environmental chamber are circumvented by unique rigid links that connect the specimen to the moiré interferometer. Displacement fields are documented while the chamber is being operated. The system is utilized to analyze thermo-mechanical behavior of a ceramic ball grid array package assembly and a plastic ball grid array package assembly. The effect of thermal cycling on the accumulated permanent deformation is documented, which reveals the temperature-dependent non-linearity of solder joints. The second apparatus is based on conduction heating and cooling to achieve a high ramp rate. A special chamber is designed and fabricated using a high power thermoelectric cooler to achieve the desired ramp rate. The system is utilized to investigate the time-dependent behavior of solder joints. A new solder joint configuration is designed and fabricated to be tested with the conduction based apparatus. The specimen is an extension of the conventional bi-material joint configuration but the unique design offers two important features; it negates the inherent shortcoming from cross sectioning required in moiré interferometry and produces a virtually uniform shear strain field at the solder joint. The deformation of solder joint is documented at a controlled ramp rate over several thermal cycles. The experimental results are analyzed and compared with those of Finite Element analysis to investigate the validity of solder constitutive models available in the literatures.