Optical Area-Based Surface Quality Assessment for In-Process Measurement

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dc.contributor.authorDeVoe, Don L.en_US
dc.contributor.authorZhang, G.M.en_US
dc.contributor.departmentISRen_US
dc.date.accessioned2007-05-23T09:54:17Z
dc.date.available2007-05-23T09:54:17Z
dc.date.issued1993en_US
dc.description.abstractThe measurement of surface finish has been recognized as an important element of Computer Integrated Manufacturing (CIM) systems which perform on-line machining systems control. Optical methods for the in-process measurement of surface roughness have been developed for this purpose, but these systems have in many cases introduced excessive complexity in the CIM system. This work presents an area-based surface characterization technique which applies the basic light scattering principles used in other optical measurement systems. These principles are applied in a novel fashion which is especially suitable for in-process measurement and control. A prototype of the optical system to implement these principles is developed in this work. The experimental results are presented to demonstrate the capabilities and future potential for integrating the measurement system into a machining process to achieve significant improvement of quality and productivity.en_US
dc.format.extent735010 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/5405
dc.language.isoen_USen_US
dc.relation.ispartofseriesISR; TR 1993-60en_US
dc.subjectcomputer aided manufacturing en_US
dc.subjectcomputer integrated manufacturing en_US
dc.subjectmanufacturingen_US
dc.subjectManufacturing Systemsen_US
dc.titleOptical Area-Based Surface Quality Assessment for In-Process Measurementen_US
dc.typeTechnical Reporten_US

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