Yield Optimization for Integrated Circuit

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dc.contributor.authorTian, H.en_US
dc.contributor.authorMilor, Lindaen_US
dc.contributor.departmentISRen_US
dc.date.accessioned2007-05-23T09:51:42Z
dc.date.available2007-05-23T09:51:42Z
dc.date.issued1992en_US
dc.description.abstractAn integrated circuits become increasingly complex, geometries smaller and smaller, it has become more difficult to achieve acceptable manufacturing yield. Four approaches to yield optimization are surveyed and compared. These include simplicial approximation, statistical modeling, the yield gradient approach, and minimax optimization.en_US
dc.format.extent880210 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/5284
dc.language.isoen_USen_US
dc.relation.ispartofseriesISR; TR 1992-103en_US
dc.subjectcomputer aided designen_US
dc.subjectcomputer aided manufacturingen_US
dc.subjectmanufacturabilityen_US
dc.subjectSystems Integrationen_US
dc.titleYield Optimization for Integrated Circuiten_US
dc.typeTechnical Reporten_US

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