Yield Optimization for Integrated Circuit
dc.contributor.author | Tian, H. | en_US |
dc.contributor.author | Milor, Linda | en_US |
dc.contributor.department | ISR | en_US |
dc.date.accessioned | 2007-05-23T09:51:42Z | |
dc.date.available | 2007-05-23T09:51:42Z | |
dc.date.issued | 1992 | en_US |
dc.description.abstract | An integrated circuits become increasingly complex, geometries smaller and smaller, it has become more difficult to achieve acceptable manufacturing yield. Four approaches to yield optimization are surveyed and compared. These include simplicial approximation, statistical modeling, the yield gradient approach, and minimax optimization. | en_US |
dc.format.extent | 880210 bytes | |
dc.format.mimetype | application/pdf | |
dc.identifier.uri | http://hdl.handle.net/1903/5284 | |
dc.language.iso | en_US | en_US |
dc.relation.ispartofseries | ISR; TR 1992-103 | en_US |
dc.subject | computer aided design | en_US |
dc.subject | computer aided manufacturing | en_US |
dc.subject | manufacturability | en_US |
dc.subject | Systems Integration | en_US |
dc.title | Yield Optimization for Integrated Circuit | en_US |
dc.type | Technical Report | en_US |
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