EFFECT OF LONG-TERM AGING ON LEAD-FREE SOLDER AND SURFACE FINISH
dc.contributor.advisor | Pecht, Michael G | en_US |
dc.contributor.advisor | Das, Diganta | en_US |
dc.contributor.author | Pandian, Guru Prasad | en_US |
dc.contributor.department | Mechanical Engineering | en_US |
dc.contributor.publisher | Digital Repository at the University of Maryland | en_US |
dc.contributor.publisher | University of Maryland (College Park, Md.) | en_US |
dc.date.accessioned | 2018-07-17T05:33:15Z | |
dc.date.available | 2018-07-17T05:33:15Z | |
dc.date.issued | 2017 | en_US |
dc.description.abstract | Since 2006, commercial electronics manufacturers have been banned from using lead-based materials and other toxic materials in their products due to the RoHS directive from the European Union. This led to industries transitioning to lead-free materials to be used in solder and surface finishes of their products. Although all of commercial electronics industry has transitioned to lead-free materials, some of the reliability and safety critical products used in industries such as defense, aerospace, automobile, and healthcare sectors are still exempted from the lead-free regulation. These industries are hesitant to transition to lead-free due to lack of data and hence the confidence on the long-term reliability of lead-free electronics. Known issues of tin whiskers and solder interconnect fatigue which can arise later in a products life have raised concerns related to the use of lead-free materials in electronic assemblies. To address these concerns, 10 year old lead-free systems were examined to determine the solder interconnect degradation level and tin whisker risk level. | en_US |
dc.identifier | https://doi.org/10.13016/M2S17SW5C | |
dc.identifier.uri | http://hdl.handle.net/1903/20751 | |
dc.language.iso | en | en_US |
dc.subject.pqcontrolled | Engineering | en_US |
dc.subject.pqcontrolled | Mechanical engineering | en_US |
dc.subject.pqcontrolled | Materials Science | en_US |
dc.subject.pquncontrolled | Electronics | en_US |
dc.subject.pquncontrolled | Lead-free | en_US |
dc.subject.pquncontrolled | Reliability | en_US |
dc.subject.pquncontrolled | RoHS | en_US |
dc.subject.pquncontrolled | Solder | en_US |
dc.subject.pquncontrolled | Tin Whisker | en_US |
dc.title | EFFECT OF LONG-TERM AGING ON LEAD-FREE SOLDER AND SURFACE FINISH | en_US |
dc.type | Thesis | en_US |
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