EFFECT OF LONG-TERM AGING ON LEAD-FREE SOLDER AND SURFACE FINISH

dc.contributor.advisorPecht, Michael Gen_US
dc.contributor.advisorDas, Digantaen_US
dc.contributor.authorPandian, Guru Prasaden_US
dc.contributor.departmentMechanical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2018-07-17T05:33:15Z
dc.date.available2018-07-17T05:33:15Z
dc.date.issued2017en_US
dc.description.abstractSince 2006, commercial electronics manufacturers have been banned from using lead-based materials and other toxic materials in their products due to the RoHS directive from the European Union. This led to industries transitioning to lead-free materials to be used in solder and surface finishes of their products. Although all of commercial electronics industry has transitioned to lead-free materials, some of the reliability and safety critical products used in industries such as defense, aerospace, automobile, and healthcare sectors are still exempted from the lead-free regulation. These industries are hesitant to transition to lead-free due to lack of data and hence the confidence on the long-term reliability of lead-free electronics. Known issues of tin whiskers and solder interconnect fatigue which can arise later in a products life have raised concerns related to the use of lead-free materials in electronic assemblies. To address these concerns, 10 year old lead-free systems were examined to determine the solder interconnect degradation level and tin whisker risk level.en_US
dc.identifierhttps://doi.org/10.13016/M2S17SW5C
dc.identifier.urihttp://hdl.handle.net/1903/20751
dc.language.isoenen_US
dc.subject.pqcontrolledEngineeringen_US
dc.subject.pqcontrolledMechanical engineeringen_US
dc.subject.pqcontrolledMaterials Scienceen_US
dc.subject.pquncontrolledElectronicsen_US
dc.subject.pquncontrolledLead-freeen_US
dc.subject.pquncontrolledReliabilityen_US
dc.subject.pquncontrolledRoHSen_US
dc.subject.pquncontrolledSolderen_US
dc.subject.pquncontrolledTin Whiskeren_US
dc.titleEFFECT OF LONG-TERM AGING ON LEAD-FREE SOLDER AND SURFACE FINISHen_US
dc.typeThesisen_US

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