NEW MATERIAL FOR ELIMINATING LINEAR ENERGY TRANSFER SENSITIVITIES IN DEEPLY SCALED CMOS TECHNOLOGIES SRAM CELLS

Abstract

As technology scales deep in submicron regime, CMOS SRAM memories have become increasingly sensitive to Single-Event Upset sensitivity. Key technological factors that impact Single-Event Upset sensitivity are gate length, gate and drain areas and the power supply voltage all of which impact transistor's nodal capacitance. In this work, I present engineering requirement studies, which show for the first time, the tread of Single-Event Upset sensitivity in deeply scaled SRAM cells. To mitigate the Single-Event Upset sensitivity, a novel approach is presented, illustrating exactly how material defects can be managed in a way that sets electrical resistance of the material as desired. A thin-film high-resistance value ranging from 2kΩ/-3.6MΩ/, and TCR of negative 0.0016%/˚C is presented. A defect model is presented that agrees well with the experimental results. These resistors are used in the cross-coupled latches; to decouple the latch nodes and delay the regenerative action of the cell, thus hardening against single even upset (SEU).