Quantitative Prediction of Tip-Sample Repulsive Forces and Sample Deformation in Tapping-Mode Frequency and Force Modulation Atomic Force Microscopy

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dc.contributor.advisorSolares, Santiago Den_US
dc.contributor.authorCrone, Joshua Cen_US
dc.contributor.departmentMechanical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2009-01-24T06:34:09Z
dc.date.available2009-01-24T06:34:09Z
dc.date.issued2008-08-27en_US
dc.description.abstractThe ability to predict sample deformation and the resultant interaction forces is a vital component to preventing sample damage and acquiring accurate height traces in atomic force microscopy (AFM). By using the recently developed frequency and force modulation (FFM) control scheme, a prediction method is developed by coupling previously developed analytical work with numerical integration of the equation of motion for the AFM tip. By selecting a zero resonance frequency shift, the sample deformation is found to depend only on those parameters defining the tip-sample interaction forces. The results are represented graphically and through a multiple regression model so that the user can predict the tip penetration and maximum repulsive force with knowledge of the maximum attractive force and steepness of the repulsive regime in the tip-sample interaction force curve. The prediction model is shown to be accurate for a wide range of imaging conditions.en_US
dc.format.extent940122 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/8741
dc.language.isoen_US
dc.subject.pqcontrolledEngineering, Mechanicalen_US
dc.subject.pqcontrolledEngineering, Mechanicalen_US
dc.subject.pquncontrolledAtomic Force Microscopyen_US
dc.subject.pquncontrolledAFMen_US
dc.subject.pquncontrolledPredictionen_US
dc.subject.pquncontrolledSample Damageen_US
dc.subject.pquncontrolledFrequency Modulationen_US
dc.subject.pquncontrolledSoft Samplesen_US
dc.titleQuantitative Prediction of Tip-Sample Repulsive Forces and Sample Deformation in Tapping-Mode Frequency and Force Modulation Atomic Force Microscopyen_US
dc.typeThesisen_US

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