Development of Advanced Warpage Measurement Systems: Shadow Moiré with Nonzero Talbot Distance and Far Infrared Twyman-Green Interferometry

dc.contributor.advisorHan, Bongtaeen_US
dc.contributor.authorCox, Austin Bradleyen_US
dc.contributor.departmentMechanical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2006-09-12T06:03:59Z
dc.date.available2006-09-12T06:03:59Z
dc.date.issued2006-08-10en_US
dc.description.abstractCoefficient of thermal expansion mismatches in microelectronic devices induce deformation when these devices are subjected to thermal loading during manufacturing or everyday operation, creating failures and other reliability concerns. High-sensitivity out-of-plane deformation measurement systems are therefore required to characterize these deformations for design analysis and model verification. Two advanced systems improving on known techniques have been developed to fill needs not met by existing systems. A novel shadow moiré implementation using the nonzero Talbot distance overcomes fundamental limitations to conventional practice, providing an enhanced dynamic range uniquely capable of measuring large deformations and non-coplanar surfaces. In addition, an advanced interferometer using an infrared source enables characterization of rough surfaces which are too diffusive for traditional visible interferometry. This system's Twyman-Green configuration also circumvents inherent limitations to previous Fizeau implementations. Results from experiments conducted on representative flip-chip specimens demonstrate both systems' unique capabilities.en_US
dc.format.extent6895663 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/3914
dc.language.isoen_US
dc.subject.pqcontrolledEngineering, Mechanicalen_US
dc.subject.pqcontrolledEngineering, Mechanicalen_US
dc.subject.pquncontrolledinfrared interferometryen_US
dc.subject.pquncontrolledshadow moireen_US
dc.subject.pquncontrolledwarpage measurementen_US
dc.titleDevelopment of Advanced Warpage Measurement Systems: Shadow Moiré with Nonzero Talbot Distance and Far Infrared Twyman-Green Interferometryen_US
dc.typeThesisen_US

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