Measuring the Complex Optical Conductivity of Graphene by Fabry-Pérot Reflectance Spectroscopy

dc.contributor.authorGhamsari, Behnood G.
dc.contributor.authorTosado, Jacob
dc.contributor.authorYamamoto, Mahito
dc.contributor.authorFuhrer, Michael S.
dc.contributor.authorAnlage, Steven M.
dc.date.accessioned2017-08-31T16:48:13Z
dc.date.available2017-08-31T16:48:13Z
dc.date.issued2016-09-29
dc.descriptionPartial funding for Open Access provided by the UMD Libraries Open Access Publishing Fund.en_US
dc.description.abstractWe have experimentally studied the dispersion of optical conductivity in few-layer graphene through reflection spectroscopy at visible wavelengths. A laser scanning microscope (LSM) with a supercontinuum laser source measured the frequency dependence of the reflectance of exfoliated graphene flakes, including monolayer, bilayer and trilayer graphene, loaded on a Si/SiO2 Fabry-Pérot resonator in the 545–700 nm range. The complex refractive index of few-layer graphene, n − ik, was extracted from the reflectance contrast to the bare substrate. It was found that each few-layer graphene possesses a unique dispersionless optical index. This feature indicates that the optical conductivity does not simply scale with the number of layers, and that inter-layer electrodynamics are significant at visible energies.en_US
dc.identifierhttps://doi.org/10.13016/M20G3GZ3D
dc.identifier.citationScientific Reports, 6:34166, DOI: 10.1038/srep34166en_US
dc.identifier.urihttp://hdl.handle.net/1903/19698
dc.language.isoen_USen_US
dc.publisherNature Publishing Groupen_US
dc.relation.isAvailableAtCollege of Computer, Mathematical & Natural Sciencesen_us
dc.relation.isAvailableAtPhysicsen_us
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_us
dc.relation.isAvailableAtUniversity of Maryland (College Park, MD)en_us
dc.titleMeasuring the Complex Optical Conductivity of Graphene by Fabry-Pérot Reflectance Spectroscopyen_US
dc.typeArticleen_US

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