CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES

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dc.contributor.advisorYang, Chia-Hungen_US
dc.contributor.authorLi, Changyien_US
dc.contributor.departmentElectrical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2005-08-03T15:50:48Z
dc.date.available2005-08-03T15:50:48Z
dc.date.issued2005-07-28en_US
dc.description.abstractIn this thesis, we present the design and applications of a cryogenic atomic force microscope (AFM) for characterization of nanostructures. The cryogenic AFM with a conductive tip can measure DC current through nanostructures. We use quartz tuning fork (QTF) as the force sensor. Unique coarse z motor design provides reliable autoapporach in the Z direction. AFM imaging with 10nm horizontal and ~2 angstrom vertical resolution has been achieved. We have used this AFM in the current-voltage characterization of diodes, and, with a modified sensing mechanism, electrical force microscopy (EFM) and magnetic force microscopy (MFM) have been demonstrated.en_US
dc.format.extent3923753 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/2727
dc.language.isoen_US
dc.subject.pqcontrolledEngineering, Electronics and Electricalen_US
dc.subject.pquncontrolledAFMen_US
dc.subject.pquncontrolledNDRen_US
dc.subject.pquncontrolledsingle electronen_US
dc.subject.pquncontrolledEFMen_US
dc.subject.pquncontrolledMFMen_US
dc.subject.pquncontrolledSPMen_US
dc.titleCRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURESen_US
dc.typeThesisen_US

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