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dc.contributor.authorGopalakrishnan, Shivakumaren_US
dc.contributor.authorZhang, Guangmingen_US
dc.date.accessioned2007-05-23T09:56:25Z
dc.date.available2007-05-23T09:56:25Z
dc.date.issued1994en_US
dc.identifier.urihttp://hdl.handle.net/1903/5504
dc.description.abstractOn-line measurement of surface roughness is an important element in a Computer Integrated Manufacturing (CIM) environment. Current methods of contact measurement are not suitable as they interfere with the machining process. Optical methods, such as laser profilometry, in general, use expensive and large equipment, which pose difficulties in the implementation on the machine tool for on-line monitoring. This paper presents an optical area based surface characterization technique which applies fractal geometry and basic light scattering principles. The novelty in this approach is that the above principles are used to facilitate in- process measurement and control. A prototype of this system is developed and the experimental results are presented. The capabilities and future potential of this system are demonstrated.en_US
dc.format.extent633270 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen_US
dc.relation.ispartofseriesISR; TR 1994-24en_US
dc.subjectimage processingen_US
dc.subjectcomputer visionen_US
dc.subjectcomputer aided manufacturing en_US
dc.subjectcomputer integrated manufacturing en_US
dc.subjectmeasurementsen_US
dc.subjectManufacturing Systemsen_US
dc.titleOn-line Assessment of Surface Roughness through Fractal Geometryen_US
dc.typeTechnical Reporten_US
dc.contributor.departmentISRen_US


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