Manufacturing-Operation Planning Versus AI Planning
dc.contributor.author | Nau, Dana S. | en_US |
dc.contributor.author | Gupta, Satyandra K. | en_US |
dc.contributor.author | Regli, William C. | en_US |
dc.date.accessioned | 2004-05-31T22:29:41Z | |
dc.date.available | 2004-05-31T22:29:41Z | |
dc.date.created | 1995-01 | en_US |
dc.date.issued | 1998-10-15 | en_US |
dc.description.abstract | Although AI planning techniques can potentially be useful in several manufacturing domains, this potential remains largely unrealized. Many of the issues important to manufacturing engineers have now seemed interesting to AI researchers -- but, in order to adapt AI planning techniques to manufacturing, it is important to address these issues in a realistic and robust manner. Furthermore, by investigating these issues, AI researchers may be able to discover principles that are relevant for AI planning in general. As an example, in this paper we describe the techniques for manufacturing- operation planning used in IMACS (Interactive Manufacturability Analysis and Critiquing System). We compare and contrast them with the techniques used in classical AI planning systems, and point out that some of the techniques used in IMACS may also be useful in other kinds of planning problems. (Also cross-referenced as UMIACS-TR-95-3) | en_US |
dc.format.extent | 511972 bytes | |
dc.format.mimetype | application/postscript | |
dc.identifier.uri | http://hdl.handle.net/1903/688 | |
dc.language.iso | en_US | |
dc.relation.isAvailableAt | Digital Repository at the University of Maryland | en_US |
dc.relation.isAvailableAt | University of Maryland (College Park, Md.) | en_US |
dc.relation.isAvailableAt | Tech Reports in Computer Science and Engineering | en_US |
dc.relation.isAvailableAt | UMIACS Technical Reports | en_US |
dc.relation.ispartofseries | UM Computer Science Department; CS-TR-3397 | en_US |
dc.relation.ispartofseries | UMIACS; UMIACS-TR-95-3 | en_US |
dc.title | Manufacturing-Operation Planning Versus AI Planning | en_US |
dc.type | Technical Report | en_US |