Extended Wavelets for Multiple Measures

dc.contributor.authorDeligiannakis, Antoniosen_US
dc.contributor.authorRoussopoulos, Nicken_US
dc.date.accessioned2004-05-31T23:27:17Z
dc.date.available2004-05-31T23:27:17Z
dc.date.created2003-03en_US
dc.date.issued2003-04-04en_US
dc.description.abstractWhile work in recent years has demonstrated that wavelets can be efficiently used to compress large quantities of data and provide fast and fairly accurate answers to queries, little emphasis has been placed on using wavelets in approximating datasets containing multiple measures. Existing decomposition approaches will either operate on each measure individually, or treat all measures as a vector of values and process them simultaneously. We show in this paper that the resulting individual or combined storage approaches for the wavelet coefficients of different measures that stem from these existing algorithms may lead to suboptimal storage utilization, which results to reduced accuracy to queries. To alleviate this problem, we introduce in this work the notion of an extended wavelet coefficient as a flexible storage method for the wavelet coefficients, and propose novel algorithms for selecting which extended wavelet coefficients to retain under a given storage constraint. Experimental results with both real and synthetic datasets demonstrate that our approach achieves improved accuracy to queries when compared to existing techniques. UMIACS-TR-2003-32en_US
dc.format.extent425488 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/1273
dc.language.isoen_US
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_US
dc.relation.isAvailableAtUniversity of Maryland (College Park, Md.)en_US
dc.relation.isAvailableAtTech Reports in Computer Science and Engineeringen_US
dc.relation.isAvailableAtUMIACS Technical Reportsen_US
dc.relation.ispartofseriesUM Computer Science Department; CS-TR-4462en_US
dc.relation.ispartofseriesUMIACS; UMIACS-TR-2003-32en_US
dc.titleExtended Wavelets for Multiple Measuresen_US
dc.typeTechnical Reporten_US

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