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The Effects of Time Delays on a Telepathology User Interface

dc.contributor.authorCarr, Daviden_US
dc.contributor.authorHasegawa, Hiroakien_US
dc.contributor.authorLemmon, Dougen_US
dc.contributor.authorPlaisant, Catherineen_US
dc.description.abstractTelepathology enables a pathologist to examine physically distant tissue samples by microscope operation over a communication link. Communication links can impose time delays which cause difficulties in controlling the remote device. Such difficulties were found in a microscope teleoperation system. Since the user interface is critical to pathologist's acceptance of telepathology, we redesigned the user interface for this system, built two different versions (a keypad whose movement commands operated by specifying a start command followed by a stop command and a trackball interface whose movement commands were incremental and directly proportional to the rotation of the trackball). We then conducted a pilot study to determine the effect of time delays on the new user interfaces. In our experiment, the keypad was the faster interface when the time delay is short. There was no evidence to favor either the keypad or trackball when the time delay was longer. Moving long distances over the microscope slide by dragging the field-of-view indicator on the touchscreen control panel improved inexperienced user performance. Also, the experiment suggests that changes could be made to improve the trackball interface. (Also cross-referenced as CAR-TR-616) (Also cross-referenced as SRC-TR-92-49)en_US
dc.format.extent700770 bytes
dc.relation.ispartofseriesUM Computer Science Department; CS-TR-2874en_US
dc.titleThe Effects of Time Delays on a Telepathology User Interfaceen_US
dc.typeTechnical Reporten_US
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_US
dc.relation.isAvailableAtUniversity of Maryland (College Park, Md.)en_US
dc.relation.isAvailableAtTech Reports in Computer Science and Engineeringen_US
dc.relation.isAvailableAtComputer Science Department Technical Reportsen_US

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