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dc.contributor.authorTravassos, Guilherme H.en_US
dc.contributor.authorShull, Forresten_US
dc.contributor.authorCarver, Jeffreyen_US
dc.contributor.authorBasili, Victoren_US
dc.date.accessioned2004-05-31T23:17:38Z
dc.date.available2004-05-31T23:17:38Z
dc.date.created2002-04en_US
dc.date.issued2002-04-05en_US
dc.identifier.urihttp://hdl.handle.net/1903/1193
dc.description.abstractInspections can be used to identify defects in software artifacts. In this way, inspection methods help to improve software quality, especially when used early in software development. Inspections of software design can be especially crucial since design defects (problems of correctness and completeness with respect to the requirements, internal consistency, or other quality attributes) can directly affect the quality of, and effort required for, the implementation. We have created a new family of "reading techniques" (so called because they help a reviewer to "read" a design artifact for the purpose of finding relevant information) that gives specific and practical guidance for identifying defects in Object-Oriented designs. Each reading technique in the family focuses the reviewer on some aspect of the design, with the goal that an inspection team applying the entire family should achieve a high degree of coverage of the design defects. In this paper, we present an overview of this new set of reading techniques. We discuss how these techniques were developed and suggest how readers can use them to detect defects in high level object oriented design UML diagrams. Also UMIACS-TR-2002-33en_US
dc.format.extent218030 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.relation.ispartofseriesUM Computer Science Department; CS-TR-4353en_US
dc.relation.ispartofseriesUMIACS; UMIACS-TR-2002-33en_US
dc.titleReading Techniques for OO Design Inspectionsen_US
dc.typeTechnical Reporten_US
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_US
dc.relation.isAvailableAtUniversity of Maryland (College Park, Md.)en_US
dc.relation.isAvailableAtTech Reports in Computer Science and Engineeringen_US
dc.relation.isAvailableAtUMIACS Technical Reportsen_US


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