Theses and Dissertations from UMD

Permanent URI for this communityhttp://hdl.handle.net/1903/2

New submissions to the thesis/dissertation collections are added automatically as they are received from the Graduate School. Currently, the Graduate School deposits all theses and dissertations from a given semester after the official graduation date. This means that there may be up to a 4 month delay in the appearance of a give thesis/dissertation in DRUM

More information is available at Theses and Dissertations at University of Maryland Libraries.

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Author: search.filters.author.Sutrisno, EdwinSubject: search.filters.subject.IGBT

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    FAULT DETECTION AND PROGNOSTICS OF INSULATED GATE BIPOLAR TRANSISTOR (IGBT) USING A K-NEAREST NEIGHBOR CLASSIFICATION ALGORITHM
    (2013) Sutrisno, Edwin; Pecht, Michael; Mechanical Engineering; Digital Repository at the University of Maryland; University of Maryland (College Park, Md.)
    Insulated Gate Bipolar Transistor (IGBT) is a power semiconductor device commonly used in medium to high power applications from household appliances, automotive, and renewable energy. Health assessment of IGBT under field use is of interest due to costly system downtime that may be associated with IGBT failures. Conventional reliability approaches were shown by experimental data to suffer from large uncertainties when predicting IGBT lifetimes, partly due to their inability to adapt to varying loading conditions and part-to-part differences. This study developed a data-driven prognostic method to individually assess IGBT health based on operating data obtained from run-to-failure experiments. IGBT health was classified into healthy and faulty using a K-Nearest Neighbor Centroid Distance classification algorithm. A feature weight optimization method was developed to determine the influence of each feature toward classifying IGBT's health states.