Contactless Spectral-Dependent Measurement of Bulk Lifetime and Surface Recombination Velocity in Silicon Photovoltaic Materials

dc.contributor.advisorDagenais, Marioen_US
dc.contributor.authorRoller, Johnen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2016-06-22T06:16:24Z
dc.date.available2016-06-22T06:16:24Z
dc.date.issued2016en_US
dc.description.abstractCharge carrier lifetime measurements in bulk or unfinished photovoltaic (PV) materials allow for a more accurate estimate of power conversion efficiency in completed solar cells. In this work, carrier lifetimes in PV- grade silicon wafers are obtained by way of quasi-steady state photoconductance measurements. These measurements use a contactless RF system coupled with varying narrow spectrum input LEDs, ranging in wavelength from 460 nm to 1030 nm. Spectral dependent lifetime measurements allow for determination of bulk and surface properties of the material, including the intrinsic bulk lifetime and the surface recombination velocity. The effective lifetimes are fit to an analytical physics-based model to determine the desired parameters. Passivated and non-passivated samples are both studied and are shown to have good agreement with the theoretical model.en_US
dc.identifierhttps://doi.org/10.13016/M27V26
dc.identifier.urihttp://hdl.handle.net/1903/18398
dc.language.isoenen_US
dc.subject.pqcontrolledElectrical engineeringen_US
dc.subject.pqcontrolledPhysicsen_US
dc.subject.pquncontrolledcarrier lifetimesen_US
dc.subject.pquncontrolledLEDsen_US
dc.subject.pquncontrolledphotoconductanceen_US
dc.subject.pquncontrolledphotovoltaicsen_US
dc.subject.pquncontrolledradio frequencyen_US
dc.subject.pquncontrolledsurface recombinationen_US
dc.titleContactless Spectral-Dependent Measurement of Bulk Lifetime and Surface Recombination Velocity in Silicon Photovoltaic Materialsen_US
dc.typeThesisen_US

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