Spin-stand imaging of overwritten data and its comparison with magnetic force microscopy

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dc.contributor.authorMayergoyz, I. D.
dc.contributor.authorTse, C.
dc.contributor.authorKrafft, C.
dc.contributor.authorGomez, R. D.
dc.date.accessioned2008-08-21T14:14:08Z
dc.date.available2008-08-21T14:14:08Z
dc.date.issued2001-06-01
dc.description.abstractA new technique of magnetic imaging on a spin-stand [Mayergoyz et al., J. Appl. Phys. 87, 6824 (2000)] is further developed and extensively tested. The results of successful imaging of digital patterns overwritten with misregistration ranging from 0.3 to 0.07 mm are reported. The results are compared with magnetic force microscopy (MFM) images and the conclusion is reached that the spin-stand imaging technique can provide (at least) the same level of resolution and accuracy as the MFM imaging technique.en
dc.format.extent187162 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationI.D. Mayergoyz, C. Tse, C. Krafft, and R.D. Gomez, "Spin-stand imaging of overwritten data and its comparison with magnetic force microscopy", Journal of Applied Physics 89, 6772-6774 (2001).en
dc.identifier.urihttp://hdl.handle.net/1903/8389
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.relation.isAvailableAtA. James Clark School of Engineeringen_us
dc.relation.isAvailableAtElectrical & Computer Engineeringen_us
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_us
dc.relation.isAvailableAtUniversity of Maryland (College Park, MD)en_us
dc.rights.licenseCopyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article may be found at http://jap.aip.org/.
dc.subjectmagnetic force microscopy (MFM)en
dc.subjectspin-stand imagingen
dc.titleSpin-stand imaging of overwritten data and its comparison with magnetic force microscopyen
dc.typeArticleen

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