Towards shot noise-limited detection of a Single-Electron Transistor

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dc.contributor.advisorSchwab, Keith C.en_US
dc.contributor.authorCamarota, Benedettaen_US
dc.contributor.departmentPhysicsen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2008-04-22T16:10:21Z
dc.date.available2008-04-22T16:10:21Z
dc.date.issued2008-01-08en_US
dc.description.abstractA Single-Electron Transistor (SET) is a highly sensitive charge amplifier based on the Coulomb blockade that can operate near the quantum limit: amplification can be accomplished with a back-action close to that required by the uncertainty principle. Its charge sensitivity is ultimately limited to about 1micre/sqrt(Hz) by the shot noise in the source-drain current. Despite the fact that such sensitivity has been approached by some, the shot-noise limit has yet to be reached for either the SET and its RF version, the RF-SET. A scheme is proposed and realized in this thesis for the shot noise-limited detection of a Single-Electron Transistor, based on a DC-SQUID impedance-matched with a DC-biased SET. SQUIDs can operate at the quantum limit, and a microstrip SQUID amplifier has already been demonstrated to operate at almost twice the quantum-limited noise temperature at about 500MHz by M. Muck and collaborators, with a sensitivity sufficient to resolve the SET shot noise. The device has been fabricated and characterized. A 50KOhm resistor has been used as a noise source at low temperature and the measured noise levels have been estimated. Moreover, the detection noise temperature of about 110mK was derived corresponding to a current sensitivity of about 8fA/sqrt(Hz) for the detection of a 100KOhm resistor.en_US
dc.format.extent8019056 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/7844
dc.language.isoen_US
dc.subject.pqcontrolledPhysics, Condensed Matteren_US
dc.subject.pquncontrolledDC-SQUIDen_US
dc.subject.pquncontrolledSETen_US
dc.subject.pquncontrolledimpedance matchingen_US
dc.subject.pquncontrolledSETen_US
dc.subject.pquncontrolledcharge noise sensitivityen_US
dc.titleTowards shot noise-limited detection of a Single-Electron Transistoren_US
dc.typeDissertationen_US

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