INVESTIGATION OF THE NONLINEAR INDEX OF REFRACTION OF WATER AT 815 AND 407 NANOMETERS

dc.contributor.advisorMilchberg, Howarden_US
dc.contributor.authorWilkes, Zacharyen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.date.accessioned2008-04-22T16:08:22Z
dc.date.available2008-04-22T16:08:22Z
dc.date.issued2007-12-10en_US
dc.description.abstractUsing a highly stable spectral interferometry technique, ultrafast processes can be measured within a 2 ps temporal window. The technique was used to measure the nonlinear index of refraction due to the optical Kerr effect in water at both 815 nm and 407 nm with pump pulse lengths of ~90 femtoseconds and ~250 femtoseconds respectively. The 815 nm measurement serves as a benchmark against previous published values while the 407 nm measurement is entirely new. Knowing the value of the nonlinear index at 407 nm allows for pulse tailoring to achieve remote underwater pulse compression and self-focusing.en_US
dc.format.extent5440086 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/1903/7792
dc.language.isoen_US
dc.subject.pqcontrolledEngineering, Electronics and Electricalen_US
dc.titleINVESTIGATION OF THE NONLINEAR INDEX OF REFRACTION OF WATER AT 815 AND 407 NANOMETERSen_US
dc.typeThesisen_US

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