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dc.contributor.authorLanubile, Filippoen_US
dc.contributor.authorVisaggio, Giuseppeen_US
dc.date.accessioned2004-05-31T22:37:56Z
dc.date.available2004-05-31T22:37:56Z
dc.date.created1996-01en_US
dc.date.issued1998-10-15en_US
dc.identifier.urihttp://hdl.handle.net/1903/801
dc.description.abstractThis paper describes an empirical comparison of several modeling techniques for predicting the quality of software components early in the software life cycle. Using software product measures, we built models that classify components as high-risk, i.e., likely to contain faults, or low-risk, i.e., likely to be free of faults. The modeling techniques evaluated in this study include principal component analysis, discriminant analysis, logistic regression, logical classification models, layered neural networks, and holographic networks. These techniques provide a good coverage of the main problem-solving paradigms: statistical analysis, machine learning, and neural networks. Using the results of independent testing, we determined the absolute worth of the predictive models and compare their performance in terms of misclassification errors, achieved quality, and verification cost. Data came from 27 software systems, developed and tested during three years of project-intensive academic courses. A surprising result is that no model was able to effectively discriminate between components with faults and components without faults. (Also cross-referenced as UMIACS-TR-96-14)en_US
dc.format.extent187739 bytes
dc.format.mimetypeapplication/postscript
dc.language.isoen_US
dc.relation.ispartofseriesUM Computer Science Department; CS-TR-3606en_US
dc.relation.ispartofseriesUMIACS; UMIACS-TR-96-14en_US
dc.titleMoving Faster Than Lighten_US
dc.typeTechnical Reporten_US
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_US
dc.relation.isAvailableAtUniversity of Maryland (College Park, Md.)en_US
dc.relation.isAvailableAtTech Reports in Computer Science and Engineeringen_US
dc.relation.isAvailableAtUMIACS Technical Reportsen_US


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