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    Testing and Characterization of Silicon Devices at Cryogenic Temperatures

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    No. of downloads: 3367

    Date
    2007-05-07
    Author
    Allnutt, Jeffrey Foster
    Advisor
    Peckerar, Martin
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    Abstract
    Satellite and space exploration applications require electronics which are capable of operation at extremely low temperatures (T<40K). Low temperature device models are essential for the design of circuits operating in these extreme environments. To address these needs, a helium Dewar test setup has been constructed and used to evaluate several MOSFET devices, a bipolar device, and a tunneling structure. The temperature dependent performance of each has been characterized down to 20K and, in some cases, as low as 4K. Complete voltage and temperature dependent MOSFET characteristics have led to the development of a simulator which predicts device performance at cryogenic temperatures. A tunneling structure has demonstrated comparable low temperature voltage reference performance to that of a silicon germanium voltage reference circuit.
    URI
    http://hdl.handle.net/1903/6951
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    • Electrical & Computer Engineering Theses and Dissertations
    • UMD Theses and Dissertations

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    DRUM is brought to you by the University of Maryland Libraries
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