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A systematic approach to statistical simulation for large scale analog circuits is presented. The statistical model takes into account mismatch between devices due to variations in the process and noise, as well as interdie ...

Planning the manufacture of machined parts requires a great deal of geometric reasoning. One of the key steps in this task is the derivation of machinable features from a solid model of the part. Regardless of the approach ...

The ability to quickly introduce new quality products is a decisive factor in capturing market share. Because of pressing demands to reduce lead time, analyzing the manufacturability of the proposed design has become an ...

Often there can be a number of ways to perform machining operations on a stock to produce a part, and only some of them are cost- and quality-effective. To determine the best machining sequence, it is necessary that each ...

Decisions made during the design of a machined part can significantly affect the product's cost, quality, and lead time. Thus, in order to address the goals of concurrent engineering, it is important to evaluate the ...

For machining purposes, a part is often considered to be a feature-based model (FBM), i.e., a collection of machining features. However, often there can be several different FBM's of the same part. These models correspond ...

In research on concurrent engineering and engineering design, the increasing use of design for manufacturability(DFM) is expanding the scope of traditional design activities in order to identify and eliminate manufacturing ...

As tolerance as a percent of feature size increases for sub- micron technologies with increased scaling, yield loses due to circuit performance fluctuations will increase. Therefore for sub-micron technologies a tradeoff ...

Analog circuits are usually tested by checking if their specifications are satisfied. This methodology is very costly. We attempt to reduce production testing time by presecuting a fault- driven methodology to handle LSI ...

An integrated circuits become increasingly complex, geometries smaller and smaller, it has become more difficult to achieve acceptable manufacturing yield. Four approaches to yield optimization are surveyed and compared. ...