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Estimation of Systematic Errors of MODIS Thermal Infrared Bands

dc.contributor.authorLiang, Shunlin
dc.contributor.authorLiu, Ronggao G.
dc.contributor.authorLiu, Jiyuan Y.
dc.date.accessioned2007-02-28T19:55:54Z
dc.date.available2007-02-28T19:55:54Z
dc.date.issued2006-10
dc.identifier.citationLiu, R., J. Liu, and S. Liang, (2006), Estimation of Systematic Errors of MODIS Thermal Infrared Bands, IEEE Geosciences and Remote Sensing Letters, 3 (4): 541-545.en
dc.identifier.urihttp://hdl.handle.net/1903/4319
dc.description.abstractThis letter reports a statistical method to estimate detector-dependent systematic error in Moderate Resolution Imaging Spectroradiometer (MODIS) thermal infrared (TIR) Bands 20–25 and 27–36. There exist scan-to-scan overlapped pixels in MODIS data. By analyzing a sufficiently large amount of those most overlapped pixels, the systematic error of each detector in the TIR bands can be estimated. The results show that the Aqua MODIS data are generally better than the Terra MODIS data in 160 MODIS TIR detectors. There are no detector-dependent systematic errors in Bands 31 and 32 for both Terra and Aqua MODIS data. The maximum detector errors are 3.00 K in Band 21 of Terra and −8.15 K in that of Aqua for brightness temperatures of more than 250 K.en
dc.format.extent482723 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen
dc.publisherInstitute of Electrical and Electronics Engineersen
dc.subjectLand surface temperatureen
dc.subjectLSTen
dc.subjectModerate Resolution Imaging Spectroradiometeren
dc.subjectMODISen
dc.subjectsystematic errorsen
dc.subjectthermal infrareden
dc.subjectTIRen
dc.titleEstimation of Systematic Errors of MODIS Thermal Infrared Bandsen
dc.typeArticleen
dc.relation.isAvailableAtCollege of Behavioral & Social Sciencesen_us
dc.relation.isAvailableAtGeographyen_us
dc.relation.isAvailableAtDigital Repository at the University of Marylanden_us
dc.relation.isAvailableAtUniversity of Maryland (College Park, Md.)en_us
dc.rights.licenseCopyright Institute of Electrical and Electronics Engineers.en_us


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