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dc.contributor.advisorQu, Gangen_US
dc.contributor.authorDunbar, Carson Josephen_US
dc.description.abstractThe system on a chip (SoC) paradigm for computing has become more prevalent in modern society. Because of this, reuse of different functional integrated circuits (ICs), with standardized inputs and outputs, make designing SoC systems easier. As a result, the theft of intellectual property for different ICs has become a highly profitable business. One method of theft-prevention is to add a signature, or fingerprint, to ICs so that they may be tracked after they are sold. The contribution of this dissertation is the creation and simulation of three new fingerprinting methods that can be implemented automatically during the design process. In addition, because manufacturing and design costs are significant, three of the fingerprinting methods presented, attempt to alleviate costs by determining the fingerprint in the post-silicon stage of the VLSI design cycle. Our first two approaches to fingerprint ICs, are to use Observability Don’t Cares (ODCs) and Satisfiability Don’t Cares (SDCs), which are almost always present in ICs, to hide our fingerprint. ODCs cause an IC to ignore certain internal signals, which we can utilize to create fingerprints that have a minimal performance overhead. Using a heuristic approach, we are also able to choose the overhead the gate will have by removing some fingerprint locations. The experiments show that this work is effective and can provide a large number of fingerprints for more substantial circuits, with a minimal overhead. SDCs are similar to ODCs except that they focus on input patterns, to gates, that cannot exist. For this work, we found a way to quickly locate most of the SDCs in a circuit and depending on the input patterns that we know will not occur, replace the gates to create a fingerprint with a minimal overhead. We also created two methods to implement this SDC fingerprinting method, each with their own advantages and disadvantages. Both the ODC and SDC fingerprinting methods can be implemented in the circuit design or physical design of the IC, and finalized in the post-silicon phase, thus reducing the cost of manufacturing several different circuits. The third method developed for this dissertation was based on our previous work on finite state machine (FSM) protection to generate a fingerprint. We show that we can edit ICs with incomplete FSMs by adding additional transitions from the set of don’t care transitions. Although the best candidates for this method are those with unused states and transitions, additional states can be added to the circuit to generate additional don’t care transitions and states, useful for generating more fingerprints. This method has the potential for an astronomical number of fingerprints, but the generated fingerprints need to be filtered for designs that have an acceptable design overhead in comparison to the original circuit. Our fourth and final method for IC fingerprinting utilizes scan-chains which help to monitor the internal state of a sequential circuit. By modifying the interconnects between flip flops in a scan chain we can create unique fingerprints that are easy to detect by the user. These modifications are done after the design for test and during the fabrication stage, which helps reduce redesign overhead. These changes can also be finalized in the post-silicon stage, similar to the work for the ODC and SDC fingerprinting, to minimize manufacturing costs. The hope with this dissertation is to demonstrate that these methods for generating fingerprints, for ICs, will improve upon the current state of the art. First, these methods will create a significant number of unique fingerprints. Second, they will create fingerprints that have an acceptable overhead and are easy to detect by the developer and are harder to detect or remove by the adversary. Finally, we show that three of the methods will reduce the cost of manufacturing by being able to be implemented in the later stages of their design cycle.en_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.contributor.departmentElectrical Engineeringen_US
dc.subject.pqcontrolledComputer engineeringen_US
dc.subject.pquncontrolledIntegrated Circuitryen_US
dc.subject.pquncontrolledIntellectual Propertyen_US

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