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Edge-Based Automated Facial Blemish Removal

dc.contributor.advisorChellappa, Ramaen_US
dc.contributor.authorNessAiver, Avishaen_US
dc.date.accessioned2014-02-04T06:31:21Z
dc.date.available2014-02-04T06:31:21Z
dc.date.issued2013en_US
dc.identifier.urihttp://hdl.handle.net/1903/14774
dc.description.abstractThis thesis presents an end-to-end approach for taking a an image of a face and seamlessly isolating and filling in any blemishes contained therein. This consists of detecting the face within a larger image, building an accurate mask of the facial features so as not to mistake them as blemishes, detecting the blemishes themselves and painting over them with accurate skin tones. We devote the first part of the thesis to detailing our algorithm for extracting facial features. This is done by first improving the image through histogram equal- ization and illumination compensation followed by finding the features themselves from a computed edge map. Geometric knowledge of general feature positioning and blemish shapes is used to determine which edge clusters belong to correspond- ing facial features. Color and reflectance thresholding is then used to build a skin map. In the second part of the thesis we identify the blemishes themselves. A Lapla- cian of Gaussian blob detector is used to identify potential candidates. Thresholding and dilating operations are then performed to trim this candidate list down followed by the use of various morphological properties to reject regions likely to not be blem- ishes. Finally, in the third part, we examine four possible techniques for inpainting blemish regions once found. We settle on using a technique that fills in pixels based on finding a patch in the nearby image region with the most similar surrounding texture to the target pixel. Priority in the pixel fill-order is given to strong edges and contours.en_US
dc.language.isoenen_US
dc.titleEdge-Based Automated Facial Blemish Removalen_US
dc.typeThesisen_US
dc.contributor.publisherDigital Repository at the University of Marylanden_US
dc.contributor.publisherUniversity of Maryland (College Park, Md.)en_US
dc.contributor.departmentElectrical Engineeringen_US
dc.subject.pqcontrolledElectrical engineeringen_US
dc.subject.pquncontrolledComputer Visionen_US
dc.subject.pquncontrolledFeature Detectionen_US
dc.subject.pquncontrolledImage Processingen_US
dc.subject.pquncontrolledSignal Processingen_US


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