Skip to content
University of Maryland LibrariesDigital Repository at the University of Maryland
    • Login
    View Item 
    •   DRUM
    • Theses and Dissertations from UMD
    • UMD Theses and Dissertations
    • View Item
    •   DRUM
    • Theses and Dissertations from UMD
    • UMD Theses and Dissertations
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    A Physics of Failure Based Qualification Process for Flexible Display Interconnect Materials

    Thumbnail
    View/Open
    Martin_umd_0117E_12489.pdf (28.55Mb)
    No. of downloads: 724

    Date
    2011
    Author
    Martin, Thomas
    Advisor
    Christou, Aris
    Metadata
    Show full item record
    Abstract
    The next paradigm shift in display technology involves making them flexible, bringing with it many challenges with respect to product reliability. To compound the problem, industry is continuously introducing novel materials and experimenting with device geometries to improve flexibility and optical performance. Hence, a method to rapidly qualify these new designs for high reliability applications is imperative. This dissertation involves the development of a qualification process for gate line interconnects used in flexible displays. The process starts with the observed failure mode of permanent horizontal lines in the displays, followed by the identification of the underlying failure mechanism. Finite element analyses are developed to determine the relationship between the physical flexing and the mechanical stress imposed on the traces. The design of an accelerated life test is performed based on the known agent of failure being cyclic bending that induces a tensile strain. A versatile dedicated test system is designed and integrated in order to rapidly capture changes in resistance of multiple traces during test. Dedicated test structures are also designed and fabricated to facilitate in-situ electrical measurements and direct observations. Since the test structures were consumed during the integration of the test system, random failure times are used in the process of determining a life-stress model. Different models are compared with respect to their applicability to the underlying failure mechanism as well as parameter estimation techniques. This methodology may be applied towards the rapid qualification of other novel materials, process conditions, and device geometries prior to their widespread use in future display systems.
    URI
    http://hdl.handle.net/1903/11933
    Collections
    • Mechanical Engineering Theses and Dissertations
    • UMD Theses and Dissertations

    DRUM is brought to you by the University of Maryland Libraries
    University of Maryland, College Park, MD 20742-7011 (301)314-1328.
    Please send us your comments.
    Web Accessibility
     

     

    Browse

    All of DRUMCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    LoginRegister
    Pages
    About DRUMAbout Download Statistics

    DRUM is brought to you by the University of Maryland Libraries
    University of Maryland, College Park, MD 20742-7011 (301)314-1328.
    Please send us your comments.
    Web Accessibility