This paper describes a methodology for optimizing the temperature dependent reliability of electronic equipment using active redundancy, while satisfying an area constraint. The process consists of transforming the objective unreliability function by adding to it a suitable penalty term so as to force the optimum solution to an almost integer" value, and minimizing the transformed objective function by a sequential quadratic programming technique. A sensitivity analysis, which avoids "perturb-and-reoptimize" methods, is then conducted to show how an incremental change in an input parameter affects the optimum solution.