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Characterization and Modeling of High Power Microwave Effects in CMOS Microelectronics
The intentional use of high power microwave (HPM) signals to disrupt microelectronic systems is a substantial threat to vital infrastructure. Conventional methods to assess HPM threats involve empirical testing of electronic ...
EMITTANCE MEASUREMENTS OF THE JEFFERSON LAB FREE ELECTRON LASER USING OPTICAL TRANSTION RADIATION
Charged particle accelerators, such as the ones that power Free Electron Lasers (FEL), require high quality (low emittance) beams for efficient operation. Accurate and reliable beam diagnostics are essential to monitoring ...